X-ray Standing Waves

The Bragg X-ray standing wave approach measures the modulation of X-ray
fluorescence as the crystal is rotated through a substrate Bragg reflection. Due to the
coherent superposition of the incident and reflected Bragg beams, an X-ray standing
wave (XSW) is formed both above and below the crystal surface. The modulation of
X-ray fluorescence by the XSW field is directly sensitive the location of the fluorescing
atoms and provides a powerful probe of interfacial ion site distributions. With a known
substrate lattice, the fluorescent yield, Y(q), can be described by two parameters:
coherent fraction, FH, and coherent position, PH, where H = (hkl) indicates the Bragg
reflection. Because the fluorescing atom is located in the near field, the XSW measurement
does not suffer from the well-known ‘phase problem’ of X-ray crystallography.

 

Reference: Bedzyk M. J. and Cheng L., "X-ray Standing Wave Studies of Minerals
and Mineral Surfaces: Principles and Applications", Reviews in Mineralogy &
Geochemistry
49, 221-266 (2002)